TEST_NAME : Wafer
TEST_DATE : 24_09_25-12_31_13
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-032-004-011-05 | FUSED_ID : 6359364768406454453
  IC_TEMP :  -57.86 | VDDM : 1128.49 | AUX_INT :   -6.78 | CsaBias :   74.38
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.01120e-03 / 2
  ADC_P0  : -6.78132e-03 ± 2.15263e-02
  ADC_P1  : 8.17386e-03 ± 5.16491e-04
  ADC_P2  : -5.74648e-06 ± 2.44195e-06
  CSA_Chi2/NDF : 1.24632e-04 / 2
  CSA_P0  : 5.76120e-02 ± 7.44624e-03
  CSA_P1  : 9.77427e-03 ± 5.61020e-04
  CSA_P2  : -4.33297e-05 ± 8.54367e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  0
 | N_BROKEN_FAST :  []
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  0
 | P_BROKEN_FAST :  []
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2338', '1.800', '0.1564', '1.800', '0.0853', '7.000', '0.7076', 1, 1, 1, 1, 1727260273.341328]
VI_after__Init : ['1.202', '0.2338', '1.800', '0.1563', '1.800', '0.0799', '7.000', '0.7078', 1, 1, 1, 1, 1727260281.511662]
VI_at__the_End : ['1.202', '0.4974', '1.799', '0.1370', '1.800', '0.1121', '7.000', '0.7085', 1, 1, 1, 1, 1727260348.768522]