TEST_NAME : Wafer
TEST_DATE : 24_09_25-12_32_51
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-032-004-012-05 | FUSED_ID : 6359364768406454469
  IC_TEMP :  -58.52 | VDDM : 1126.81 | AUX_INT : -104.56 | CsaBias :    0.57
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.38248e-03 / 2
  ADC_P0  : -1.04564e-01 ± 3.02575e-02
  ADC_P1  : 9.67505e-03 ± 7.02984e-04
  ADC_P2  : -1.06329e-05 ± 3.20780e-06
  CSA_Chi2/NDF : 1.43789e-04 / 2
  CSA_P0  : 5.85025e-02 ± 7.99807e-03
  CSA_P1  : 9.67060e-03 ± 6.02597e-04
  CSA_P2  : -4.40007e-05 ± 9.17684e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  0
 | N_BROKEN_FAST :  []
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  2
 | P_BROKEN_FAST :  [21, 117]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  A ASIC READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3736', '1.799', '0.1424', '1.800', '0.0940', '7.000', '0.7085', 1, 1, 1, 1, 1727260371.6209073]
VI_after__Init : ['1.202', '0.3737', '1.799', '0.1425', '1.800', '0.0867', '7.000', '0.7079', 1, 1, 1, 1, 1727260379.7522552]
VI_at__the_End : ['1.202', '0.4866', '1.800', '0.1378', '1.804', '0.1118', '7.000', '0.7086', 1, 1, 1, 1, 1727260447.3351002]