TEST_NAME : Wafer
TEST_DATE : 24_09_25-12_34_29
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-032-004-013-05 | FUSED_ID : 6359364768406454485
  IC_TEMP :  -56.45 | VDDM : 1124.77 | AUX_INT :   -8.75 | CsaBias :   81.90
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.52602e-03 / 2
  ADC_P0  : -8.74738e-03 ± 2.64916e-02
  ADC_P1  : 8.30521e-03 ± 6.41980e-04
  ADC_P2  : -5.86003e-06 ± 3.07978e-06
  CSA_Chi2/NDF : 1.03576e-04 / 2
  CSA_P0  : 5.75054e-02 ± 6.78814e-03
  CSA_P1  : 9.28692e-03 ± 5.11438e-04
  CSA_P2  : -3.80044e-05 ± 7.78859e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  2
 | N_BROKEN_FAST :  [6, 67]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  1
 | P_BROKEN_FAST :  [101]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3222', '1.800', '0.1806', '1.799', '0.0931', '7.000', '0.7078', 1, 1, 1, 1, 1727260469.031445]
VI_after__Init : ['1.202', '0.3221', '1.800', '0.1807', '1.799', '0.0874', '7.000', '0.7080', 1, 1, 1, 1, 1727260477.0287719]
VI_at__the_End : ['1.202', '0.4857', '1.802', '0.1361', '1.799', '0.1110', '7.000', '0.7083', 1, 1, 1, 1, 1727260536.5043547]