TEST_NAME : Wafer
TEST_DATE : 24_09_25-12_36_06
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
------------------------------------------------------------
------------------------------------------------------------
ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-032-004-014-05 | FUSED_ID : 6359364768406454501
  IC_TEMP :  -57.37 | VDDM : 1126.67 | AUX_INT :   -7.47 | CsaBias :   78.57
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 8.61285e-04 / 2
  ADC_P0  : -7.46970e-03 ± 1.97774e-02
  ADC_P1  : 8.67862e-03 ± 4.87902e-04
  ADC_P2  : -7.45150e-06 ± 2.37123e-06
  CSA_Chi2/NDF : 8.92853e-05 / 2
  CSA_P0  : 5.95515e-02 ± 6.30249e-03
  CSA_P1  : 9.47189e-03 ± 4.74847e-04
  CSA_P2  : -3.97707e-05 ± 7.23136e-06
------------------------------------------------------------
ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  2
 | N_BROKEN_FAST :  [9, 111]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  2
 | P_BROKEN_FAST :  [47, 52]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
------------------------------------------------------------
------------------------------------------------------------
VI_before_Init : ['1.202', '0.2850', '1.800', '0.1648', '1.800', '0.0890', '7.000', '0.7086', 1, 1, 1, 1, 1727260566.567017]
VI_after__Init : ['1.202', '0.2850', '1.800', '0.1649', '1.800', '0.0811', '7.000', '0.7079', 1, 1, 1, 1, 1727260574.8134034]
VI_at__the_End : ['1.198', '0.4969', '1.800', '0.1367', '1.803', '0.1106', '7.000', '0.7088', 1, 1, 1, 1, 1727260641.4903746]