TEST_NAME : Wafer
TEST_DATE : 24_09_25-12_37_45
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-032-004-015-05 | FUSED_ID : 6359364768406454517
  IC_TEMP :  -54.70 | VDDM : 1127.77 | AUX_INT :   -8.75 | CsaBias :   87.87
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.27115e-03 / 2
  ADC_P0  : -8.75370e-03 ± 2.41416e-02
  ADC_P1  : 8.11932e-03 ± 5.70265e-04
  ADC_P2  : -5.60699e-06 ± 2.67283e-06
  CSA_Chi2/NDF : 8.41433e-05 / 2
  CSA_P0  : 5.70155e-02 ± 6.11832e-03
  CSA_P1  : 9.53083e-03 ± 4.60971e-04
  CSA_P2  : -4.01932e-05 ± 7.02005e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  2
 | N_BROKEN_FAST :  [10, 108]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  1
 | P_BROKEN_FAST :  [18]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3724', '1.800', '0.1385', '1.800', '0.0849', '7.000', '0.7079', 1, 1, 1, 1, 1727260664.9565816]
VI_after__Init : ['1.202', '0.3721', '1.800', '0.1385', '1.800', '0.0796', '7.000', '0.7079', 1, 1, 1, 1, 1727260673.097981]
VI_at__the_End : ['1.199', '0.4923', '1.800', '0.1350', '1.800', '0.1099', '7.000', '0.7085', 1, 1, 1, 1, 1727260742.1106794]