TEST_NAME : Wafer
TEST_DATE : 24_09_25-12_39_23
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-032-004-016-02 | FUSED_ID : 6359364768406454530
  IC_TEMP :  -54.28 | VDDM : 1127.93 | AUX_INT :   -8.81 | CsaBias :   83.49
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.37467e-03 / 2
  ADC_P0  : -8.80858e-03 ± 2.50956e-02
  ADC_P1  : 8.46223e-03 ± 6.12031e-04
  ADC_P2  : -6.47184e-06 ± 2.95422e-06
  CSA_Chi2/NDF : 9.97381e-05 / 2
  CSA_P0  : 5.86333e-02 ± 6.66120e-03
  CSA_P1  : 9.81990e-03 ± 5.01874e-04
  CSA_P2  : -4.27023e-05 ± 7.64294e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  0
 | N_BROKEN_FAST :  []
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  2
 | P_BROKEN_FAST :  [14, 32]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.4002', '1.800', '0.1881', '1.800', '0.0978', '7.000', '0.7079', 1, 1, 1, 1, 1727260762.8951154]
VI_after__Init : ['1.202', '0.3999', '1.800', '0.1874', '1.800', '0.0928', '7.000', '0.7077', 1, 1, 1, 1, 1727260770.9185133]
VI_at__the_End : ['1.201', '0.5025', '1.800', '0.1375', '1.800', '0.1097', '7.000', '0.7086', 1, 1, 1, 1, 1727260837.5404513]