TEST_NAME : Wafer
TEST_DATE : 24_09_25-12_44_16
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-032-004-019-02 | FUSED_ID : 6359364768406454578
  IC_TEMP :  -61.98 | VDDM : 1117.66 | AUX_INT :   -7.66 | CsaBias :   73.74
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.05723e-03 / 2
  ADC_P0  : -7.66204e-03 ± 2.20010e-02
  ADC_P1  : 8.19823e-03 ± 5.26780e-04
  ADC_P2  : -5.78537e-06 ± 2.49293e-06
  CSA_Chi2/NDF : 1.15103e-04 / 2
  CSA_P0  : 5.65875e-02 ± 7.15593e-03
  CSA_P1  : 9.32137e-03 ± 5.39147e-04
  CSA_P2  : -4.06110e-05 ± 8.21058e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  0
 | N_BROKEN_FAST :  []
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  1
 | P_BROKEN_FAST :  [123]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2967', '1.800', '0.1472', '1.800', '0.0874', '7.000', '0.7079', 1, 1, 1, 1, 1727261056.0887787]
VI_after__Init : ['1.201', '0.2963', '1.800', '0.1472', '1.800', '0.0817', '7.000', '0.7076', 1, 1, 1, 1, 1727261064.242122]
VI_at__the_End : ['1.201', '0.4779', '1.800', '0.1356', '1.800', '0.1113', '7.000', '0.7086', 1, 1, 1, 1, 1727261123.063614]