TEST_NAME : Wafer
TEST_DATE : 24_09_25-12_45_53
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-032-004-020-02 | FUSED_ID : 6359364768406454594
  IC_TEMP :  -65.14 | VDDM : 1133.07 | AUX_INT :   -9.00 | CsaBias :   68.32
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.53346e-03 / 2
  ADC_P0  : -8.99675e-03 ± 2.65638e-02
  ADC_P1  : 8.64777e-03 ± 6.69539e-04
  ADC_P2  : -6.29113e-06 ± 3.34824e-06
  CSA_Chi2/NDF : 1.69186e-04 / 2
  CSA_P0  : 5.71337e-02 ± 8.67571e-03
  CSA_P1  : 1.03750e-02 ± 6.53652e-04
  CSA_P2  : -5.34610e-05 ± 9.95435e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  0
 | N_BROKEN_FAST :  []
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  3
 | P_BROKEN_FAST :  [15, 30, 57]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3601', '1.800', '0.1547', '1.800', '0.0922', '7.000', '0.7077', 1, 1, 1, 1, 1727261153.1043904]
VI_after__Init : ['1.202', '0.3607', '1.800', '0.1547', '1.800', '0.0864', '7.000', '0.7079', 1, 1, 1, 1, 1727261161.8497238]
VI_at__the_End : ['1.202', '0.4948', '1.800', '0.1405', '1.800', '0.1148', '7.000', '0.7085', 1, 1, 1, 1, 1727261227.5366714]