TEST_NAME : Wafer
TEST_DATE : 24_09_25-12_50_46
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-032-004-023-02 | FUSED_ID : 6359364768406454642
  IC_TEMP :  -55.86 | VDDM : 1127.30 | AUX_INT :   -7.65 | CsaBias :   83.28
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.03836e-03 / 2
  ADC_P0  : -7.65122e-03 ± 2.18176e-02
  ADC_P1  : 8.32882e-03 ± 5.34823e-04
  ADC_P2  : -5.67125e-06 ± 2.59601e-06
  CSA_Chi2/NDF : 9.67146e-05 / 2
  CSA_P0  : 5.74174e-02 ± 6.55946e-03
  CSA_P1  : 9.43724e-03 ± 4.94208e-04
  CSA_P2  : -3.87010e-05 ± 7.52621e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [21]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  1
 | P_BROKEN_FAST :  [22]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.4421', '1.800', '0.1588', '1.800', '0.0998', '7.000', '0.7080', 1, 1, 1, 1, 1727261446.1010308]
VI_after__Init : ['1.202', '0.4424', '1.800', '0.1588', '1.800', '0.0943', '7.000', '0.7079', 1, 1, 1, 1, 1727261454.1203904]
VI_at__the_End : ['1.202', '0.4957', '1.800', '0.1384', '1.800', '0.1108', '7.000', '0.7086', 1, 1, 1, 1, 1727261514.3050559]