TEST_NAME : Wafer
TEST_DATE : 24_09_25-13_26_38
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-032-005-004-08 | FUSED_ID : 6359364768406458440
  IC_TEMP :  -66.62 | VDDM : 1119.70 | AUX_INT :  -10.23 | CsaBias :   69.29
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.69355e-03 / 2
  ADC_P0  : -1.02321e-02 ± 2.78918e-02
  ADC_P1  : 8.89818e-03 ± 7.12542e-04
  ADC_P2  : -6.96908e-06 ± 3.62433e-06
  CSA_Chi2/NDF : 2.44528e-04 / 2
  CSA_P0  : 5.71640e-02 ± 1.04300e-02
  CSA_P1  : 1.02700e-02 ± 7.85829e-04
  CSA_P2  : -5.48982e-05 ± 1.19672e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  2
 | N_BROKEN_FAST :  [17, 110]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  2
 | P_BROKEN_FAST :  [72, 106]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2546', '1.800', '0.2086', '1.800', '0.0906', '7.000', '0.7090', 1, 1, 1, 1, 1727263598.1414711]
VI_after__Init : ['1.202', '0.2544', '1.799', '0.2087', '1.800', '0.0831', '7.000', '0.7083', 1, 1, 1, 1, 1727263606.9077694]
VI_at__the_End : ['1.201', '0.4837', '1.800', '0.1415', '1.800', '0.1130', '7.000', '0.7090', 1, 1, 1, 1, 1727263667.506783]