TEST_NAME : Wafer
TEST_DATE : 24_09_25-13_25_01
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-032-005-005-08 | FUSED_ID : 6359364768406458456
  IC_TEMP :  -61.82 | VDDM : 1116.90 | AUX_INT :   -9.47 | CsaBias :   74.67
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.54456e-03 / 2
  ADC_P0  : -9.46779e-03 ± 2.66580e-02
  ADC_P1  : 8.47245e-03 ± 6.60125e-04
  ADC_P2  : -5.82315e-06 ± 3.25245e-06
  CSA_Chi2/NDF : 1.63595e-04 / 2
  CSA_P0  : 5.65335e-02 ± 8.53114e-03
  CSA_P1  : 9.79380e-03 ± 6.42760e-04
  CSA_P2  : -4.76608e-05 ± 9.78848e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [77]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  1
 | P_BROKEN_FAST :  [67]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3116', '1.800', '0.1524', '1.800', '0.0890', '7.000', '0.7082', 1, 1, 1, 1, 1727263501.0985692]
VI_after__Init : ['1.201', '0.3114', '1.800', '0.1525', '1.800', '0.0834', '7.000', '0.7080', 1, 1, 1, 1, 1727263509.3418007]
VI_at__the_End : ['1.201', '0.4796', '1.800', '0.1371', '1.800', '0.1154', '7.000', '0.7089', 1, 1, 1, 1, 1727263577.1852224]