TEST_NAME : Wafer
TEST_DATE : 24_09_25-13_10_20
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-032-005-014-08 | FUSED_ID : 6359364768406458600
  IC_TEMP :  -54.92 | VDDM : 1130.53 | AUX_INT : -122.72 | CsaBias :  -16.50
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.18850e-03 / 2
  ADC_P0  : -1.22716e-01 ± 2.92701e-02
  ADC_P1  : 9.77290e-03 ± 6.78120e-04
  ADC_P2  : -1.06166e-05 ± 3.08229e-06
  CSA_Chi2/NDF : 1.05951e-04 / 2
  CSA_P0  : 5.91910e-02 ± 6.86554e-03
  CSA_P1  : 9.57307e-03 ± 5.17269e-04
  CSA_P2  : -4.22711e-05 ± 7.87739e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [76]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  1
 | P_BROKEN_FAST :  [16]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.4241', '1.800', '0.1576', '1.800', '0.1023', '7.000', '0.7080', 1, 1, 1, 1, 1727262620.3103447]
VI_after__Init : ['1.201', '0.4243', '1.800', '0.1575', '1.799', '0.0964', '7.000', '0.7082', 1, 1, 1, 1, 1727262629.0796828]
VI_at__the_End : ['1.201', '0.4900', '1.800', '0.1390', '1.800', '0.1100', '7.000', '0.7086', 1, 1, 1, 1, 1727262689.099095]