TEST_NAME : Wafer
TEST_DATE : 24_09_25-13_08_43
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-032-005-015-08 | FUSED_ID : 6359364768406458616
  IC_TEMP :  -54.12 | VDDM : 1116.14 | AUX_INT :   -7.14 | CsaBias :   80.51
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.03752e-03 / 2
  ADC_P0  : -7.13508e-03 ± 2.17975e-02
  ADC_P1  : 8.02885e-03 ± 5.12684e-04
  ADC_P2  : -5.56817e-06 ± 2.37742e-06
  CSA_Chi2/NDF : 7.95250e-05 / 2
  CSA_P0  : 5.76279e-02 ± 5.94804e-03
  CSA_P1  : 9.34472e-03 ± 4.48142e-04
  CSA_P2  : -3.81505e-05 ± 6.82468e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [59]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  2
 | P_BROKEN_FAST :  [18, 24]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  A ASIC READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2716', '1.800', '0.1457', '1.800', '0.0834', '7.000', '0.7080', 1, 1, 1, 1, 1727262522.6897514]
VI_after__Init : ['1.201', '0.2715', '1.800', '0.1458', '1.800', '0.0787', '7.000', '0.7081', 1, 1, 1, 1, 1727262530.796166]
VI_at__the_End : ['1.201', '0.4908', '1.800', '0.1368', '1.799', '0.1104', '7.000', '0.7088', 1, 1, 1, 1, 1727262598.095992]