TEST_NAME : Wafer
TEST_DATE : 24_09_25-13_07_05
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-032-005-016-15 | FUSED_ID : 6359364768406458639
  IC_TEMP :  -59.61 | VDDM : 1121.11 | AUX_INT :   -9.82 | CsaBias :   82.81
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.45204e-03 / 2
  ADC_P0  : -9.81760e-03 ± 2.57887e-02
  ADC_P1  : 8.49089e-03 ± 6.29506e-04
  ADC_P2  : -6.34243e-06 ± 3.05808e-06
  CSA_Chi2/NDF : 1.55756e-04 / 2
  CSA_P0  : 5.90435e-02 ± 8.32425e-03
  CSA_P1  : 1.00771e-02 ± 6.27172e-04
  CSA_P2  : -4.87594e-05 ± 9.55109e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  0
 | N_BROKEN_FAST :  []
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  0
 | P_BROKEN_FAST :  []
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3357', '1.800', '0.1311', '1.800', '0.0951', '7.000', '0.7079', 1, 1, 1, 1, 1727262424.8601103]
VI_after__Init : ['1.201', '0.3358', '1.800', '0.1310', '1.799', '0.0894', '7.000', '0.7079', 1, 1, 1, 1, 1727262433.0434527]
VI_at__the_End : ['1.201', '0.4978', '1.800', '0.1403', '1.806', '0.1133', '7.000', '0.7087', 1, 1, 1, 1, 1727262492.072911]