TEST_NAME : Wafer
TEST_DATE : 24_09_25-13_05_27
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-032-005-017-15 | FUSED_ID : 6359364768406458655
  IC_TEMP :  -58.25 | VDDM : 1123.04 | AUX_INT :   -7.18 | CsaBias :   79.94
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.05896e-03 / 2
  ADC_P0  : -7.18221e-03 ± 2.20894e-02
  ADC_P1  : 7.96797e-03 ± 5.31758e-04
  ADC_P2  : -4.36258e-06 ± 2.54013e-06
  CSA_Chi2/NDF : 1.00577e-04 / 2
  CSA_P0  : 5.69666e-02 ± 6.68916e-03
  CSA_P1  : 9.77329e-03 ± 5.03980e-04
  CSA_P2  : -4.59401e-05 ± 7.67502e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  2
 | N_BROKEN_FAST :  [3, 101]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  1
 | P_BROKEN_FAST :  [52]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.4106', '1.800', '0.1416', '1.800', '0.0996', '7.000', '0.7081', 1, 1, 1, 1, 1727262327.1335154]
VI_after__Init : ['1.201', '0.4109', '1.800', '0.1417', '1.800', '0.0938', '7.000', '0.7080', 1, 1, 1, 1, 1727262335.3349538]
VI_at__the_End : ['1.201', '0.4838', '1.799', '0.1379', '1.800', '0.1131', '7.000', '0.7086', 1, 1, 1, 1, 1727262402.625797]