TEST_NAME : Wafer
TEST_DATE : 24_09_25-13_03_49
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-032-005-018-15 | FUSED_ID : 6359364768406458671
  IC_TEMP :  -64.36 | VDDM : 1120.93 | AUX_INT :   -8.83 | CsaBias :   67.73
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.18634e-03 / 2
  ADC_P0  : -8.83027e-03 ± 2.33000e-02
  ADC_P1  : 8.56301e-03 ± 5.78657e-04
  ADC_P2  : -6.28052e-06 ± 2.85547e-06
  CSA_Chi2/NDF : 1.76008e-04 / 2
  CSA_P0  : 5.71525e-02 ± 8.84887e-03
  CSA_P1  : 1.02624e-02 ± 6.66699e-04
  CSA_P2  : -5.52338e-05 ± 1.01530e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  3
 | N_BROKEN_FAST :  [3, 31, 43]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  2
 | P_BROKEN_FAST :  [48, 57]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.1612', '1.800', '0.1303', '1.800', '0.0821', '7.000', '0.7079', 1, 1, 1, 1, 1727262228.5049214]
VI_after__Init : ['1.202', '0.1613', '1.800', '0.1302', '1.800', '0.0767', '7.000', '0.7079', 1, 1, 1, 1, 1727262237.3222551]
VI_at__the_End : ['1.201', '0.4797', '1.800', '0.1374', '1.807', '0.1148', '7.000', '0.7089', 1, 1, 1, 1, 1727262305.0491712]