TEST_NAME : Wafer
TEST_DATE : 24_09_25-13_02_11
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-032-005-019-15 | FUSED_ID : 6359364768406458687
  IC_TEMP :  -64.00 | VDDM : 1112.49 | AUX_INT :   -8.89 | CsaBias :   65.55
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.39053e-03 / 2
  ADC_P0  : -8.88520e-03 ± 2.52241e-02
  ADC_P1  : 8.32934e-03 ± 6.00984e-04
  ADC_P2  : -6.53654e-06 ± 2.82865e-06
  CSA_Chi2/NDF : 1.19056e-04 / 2
  CSA_P0  : 5.62641e-02 ± 7.27777e-03
  CSA_P1  : 9.53668e-03 ± 5.48328e-04
  CSA_P2  : -4.62402e-05 ± 8.35038e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  3
 | N_BROKEN_FAST :  [4, 84, 92]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  0
 | P_BROKEN_FAST :  []
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3602', '1.799', '0.1483', '1.800', '0.0948', '7.000', '0.7087', 1, 1, 1, 1, 1727262131.1612418]
VI_after__Init : ['1.202', '0.3603', '1.800', '0.1485', '1.799', '0.0868', '7.000', '0.7080', 1, 1, 1, 1, 1727262139.9395509]
VI_at__the_End : ['1.202', '0.4697', '1.800', '0.1355', '1.801', '0.1142', '7.000', '0.7086', 1, 1, 1, 1, 1727262200.160039]