TEST_NAME : Wafer
TEST_DATE : 24_09_25-13_00_33
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
------------------------------------------------------------
------------------------------------------------------------
ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-032-005-020-15 | FUSED_ID : 6359364768406458703
  IC_TEMP :  -54.79 | VDDM : 1114.35 | AUX_INT :   -8.63 | CsaBias :   73.41
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.27791e-03 / 2
  ADC_P0  : -8.62605e-03 ± 2.42138e-02
  ADC_P1  : 8.26083e-03 ± 5.83545e-04
  ADC_P2  : -5.74224e-06 ± 2.78928e-06
  CSA_Chi2/NDF : 1.29229e-04 / 2
  CSA_P0  : 5.83122e-02 ± 7.58231e-03
  CSA_P1  : 9.62878e-03 ± 5.71273e-04
  CSA_P2  : -4.39212e-05 ± 8.69981e-06
------------------------------------------------------------
ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  3
 | N_BROKEN_FAST :  [13, 96, 123]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  2
 | P_BROKEN_FAST :  [39, 86]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
------------------------------------------------------------
------------------------------------------------------------
VI_before_Init : ['1.202', '0.2373', '1.800', '0.1500', '1.800', '0.0914', '7.000', '0.7080', 1, 1, 1, 1, 1727262033.5355868]
VI_after__Init : ['1.202', '0.2371', '1.800', '0.1501', '1.799', '0.0865', '7.000', '0.7079', 1, 1, 1, 1, 1727262041.7778642]
VI_at__the_End : ['1.201', '0.4891', '1.800', '0.1353', '1.800', '0.1119', '7.000', '0.7086', 1, 1, 1, 1, 1727262108.3378918]