TEST_NAME : Wafer
TEST_DATE : 24_09_25-12_58_55
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-032-005-021-15 | FUSED_ID : 6359364768406458719
  IC_TEMP :  -67.72 | VDDM : 1121.91 | AUX_INT :   -8.88 | CsaBias :   73.47
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.48316e-03 / 2
  ADC_P0  : -8.87738e-03 ± 2.61247e-02
  ADC_P1  : 8.29087e-03 ± 6.35102e-04
  ADC_P2  : -5.60168e-06 ± 3.06369e-06
  CSA_Chi2/NDF : 1.89223e-04 / 2
  CSA_P0  : 5.75566e-02 ± 9.17507e-03
  CSA_P1  : 1.01264e-02 ± 6.91275e-04
  CSA_P2  : -5.43732e-05 ± 1.05273e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  4
 | N_BROKEN_FAST :  [24, 42, 48, 118]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  1
 | P_BROKEN_FAST :  [104]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3687', '1.800', '0.1607', '1.800', '0.0940', '7.000', '0.7079', 1, 1, 1, 1, 1727261935.3218942]
VI_after__Init : ['1.201', '0.3682', '1.800', '0.1608', '1.799', '0.0891', '7.000', '0.7080', 1, 1, 1, 1, 1727261943.540283]
VI_at__the_End : ['1.202', '0.4775', '1.800', '0.1374', '1.799', '0.1167', '7.000', '0.7086', 1, 1, 1, 1, 1727262010.4802618]