TEST_NAME : Wafer
TEST_DATE : 24_09_25-12_57_17
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-032-005-022-15 | FUSED_ID : 6359364768406458735
  IC_TEMP :  -55.13 | VDDM : 1119.09 | AUX_INT :   -8.08 | CsaBias :   81.45
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.17911e-03 / 2
  ADC_P0  : -8.07604e-03 ± 2.32833e-02
  ADC_P1  : 8.19480e-03 ± 5.65933e-04
  ADC_P2  : -5.12639e-06 ± 2.73263e-06
  CSA_Chi2/NDF : 1.33801e-04 / 2
  CSA_P0  : 5.95542e-02 ± 7.71528e-03
  CSA_P1  : 1.00882e-02 ± 5.81291e-04
  CSA_P2  : -4.77543e-05 ± 8.85237e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [3]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  3
 | P_BROKEN_FAST :  [53, 87, 114]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3948', '1.800', '0.1494', '1.800', '0.0928', '7.000', '0.7079', 1, 1, 1, 1, 1727261837.584205]
VI_after__Init : ['1.201', '0.3949', '1.800', '0.1494', '1.800', '0.0872', '7.000', '0.7079', 1, 1, 1, 1, 1727261845.7745945]
VI_at__the_End : ['1.201', '0.5015', '1.800', '0.1380', '1.800', '0.1115', '7.000', '0.7085', 1, 1, 1, 1, 1727261905.3151884]