TEST_NAME : Wafer
TEST_DATE : 24_09_25-12_54_01
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-032-005-024-15 | FUSED_ID : 6359364768406458767
  IC_TEMP :  -58.81 | VDDM : 1113.54 | AUX_INT :   -9.50 | CsaBias :   82.81
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.51814e-03 / 2
  ADC_P0  : -9.49951e-03 ± 2.64372e-02
  ADC_P1  : 8.45255e-03 ± 6.56809e-04
  ADC_P2  : -5.52935e-06 ± 3.25456e-06
  CSA_Chi2/NDF : 1.88284e-04 / 2
  CSA_P0  : 5.71869e-02 ± 9.15229e-03
  CSA_P1  : 1.00301e-02 ± 6.89559e-04
  CSA_P2  : -4.85136e-05 ± 1.05012e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [21]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  2
 | P_BROKEN_FAST :  [55, 56]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3705', '1.800', '0.1356', '1.800', '0.0926', '7.000', '0.7080', 1, 1, 1, 1, 1727261641.0767524]
VI_after__Init : ['1.201', '0.3708', '1.799', '0.1356', '1.800', '0.0870', '7.000', '0.7079', 1, 1, 1, 1, 1727261649.9191492]
VI_at__the_End : ['1.201', '0.4962', '1.800', '0.1376', '1.800', '0.1125', '7.000', '0.7085', 1, 1, 1, 1, 1727261714.5962875]