TEST_NAME : Wafer
TEST_DATE : 24_09_25-12_52_23
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-032-005-025-15 | FUSED_ID : 6359364768406458783
  IC_TEMP :  -58.66 | VDDM : 1112.27 | AUX_INT :   -9.07 | CsaBias :   83.18
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.36045e-03 / 2
  ADC_P0  : -9.07194e-03 ± 2.49733e-02
  ADC_P1  : 8.45496e-03 ± 6.10971e-04
  ADC_P2  : -6.23622e-06 ± 2.96550e-06
  CSA_Chi2/NDF : 1.51730e-04 / 2
  CSA_P0  : 5.72839e-02 ± 8.21597e-03
  CSA_P1  : 9.90670e-03 ± 6.19014e-04
  CSA_P2  : -4.59532e-05 ± 9.42685e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [65]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  2
 | P_BROKEN_FAST :  [65, 125]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.4237', '1.800', '0.1326', '1.800', '0.0945', '7.000', '0.7080', 1, 1, 1, 1, 1727261543.5669518]
VI_after__Init : ['1.202', '0.4240', '1.800', '0.1326', '1.800', '0.0892', '7.000', '0.7079', 1, 1, 1, 1, 1727261551.8173141]
VI_at__the_End : ['1.201', '0.4919', '1.800', '0.1367', '1.800', '0.1112', '7.000', '0.7086', 1, 1, 1, 1, 1727261618.1035001]