TEST_NAME : Wafer
TEST_DATE : 24_09_25-13_29_54
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-032-006-004-06 | FUSED_ID : 6359364768406462534
  IC_TEMP :  -65.15 | VDDM : 1100.79 | AUX_INT :   -7.99 | CsaBias :   79.87
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.00340e-03 / 2
  ADC_P0  : -7.98888e-03 ± 2.14014e-02
  ADC_P1  : 8.85632e-03 ± 5.47675e-04
  ADC_P2  : -7.03999e-06 ± 2.77426e-06
  CSA_Chi2/NDF : 1.82161e-04 / 2
  CSA_P0  : 5.77871e-02 ± 9.00222e-03
  CSA_P1  : 1.03207e-02 ± 6.78253e-04
  CSA_P2  : -5.11088e-05 ± 1.03290e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  0
 | N_BROKEN_FAST :  []
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  0
 | P_BROKEN_FAST :  []
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2144', '1.800', '0.1492', '1.800', '0.0832', '7.000', '0.7079', 1, 1, 1, 1, 1727263794.273495]
VI_after__Init : ['1.202', '0.2145', '1.800', '0.1492', '1.800', '0.0781', '7.000', '0.7077', 1, 1, 1, 1, 1727263802.2829971]
VI_at__the_End : ['1.201', '0.5004', '1.800', '0.1414', '1.799', '0.1125', '7.000', '0.7086', 1, 1, 1, 1, 1727263868.9555418]