TEST_NAME : Wafer
TEST_DATE : 24_09_25-13_31_31
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-032-006-005-06 | FUSED_ID : 6359364768406462550
  IC_TEMP :  -55.67 | VDDM : 1125.54 | AUX_INT :   -6.17 | CsaBias :   89.96
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 7.99741e-04 / 2
  ADC_P0  : -6.17441e-03 ± 1.91351e-02
  ADC_P1  : 8.07455e-03 ± 4.59047e-04
  ADC_P2  : -5.25631e-06 ± 2.17239e-06
  CSA_Chi2/NDF : 1.17499e-04 / 2
  CSA_P0  : 5.73994e-02 ± 7.23003e-03
  CSA_P1  : 9.68687e-03 ± 5.44731e-04
  CSA_P2  : -4.20375e-05 ± 8.29560e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  0
 | N_BROKEN_FAST :  []
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  0
 | P_BROKEN_FAST :  []
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  A ASIC READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.1902', '1.800', '0.1897', '1.800', '0.0833', '7.000', '0.7079', 1, 1, 1, 1, 1727263891.1508198]
VI_after__Init : ['1.201', '0.1904', '1.800', '0.1896', '1.800', '0.0775', '7.000', '0.7077', 1, 1, 1, 1, 1727263900.006079]
VI_at__the_End : ['1.201', '0.4942', '1.800', '0.1386', '1.800', '0.1114', '7.000', '0.7084', 1, 1, 1, 1, 1727263966.9777114]