TEST_NAME : Wafer
TEST_DATE : 24_09_25-13_33_09
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-032-006-006-06 | FUSED_ID : 6359364768406462566
  IC_TEMP :  -66.37 | VDDM : 1118.14 | AUX_INT :  -10.11 | CsaBias :   70.70
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.71537e-03 / 2
  ADC_P0  : -1.01126e-02 ± 2.80815e-02
  ADC_P1  : 9.04272e-03 ± 7.33127e-04
  ADC_P2  : -7.02672e-06 ± 3.80943e-06
  CSA_Chi2/NDF : 1.96992e-04 / 2
  CSA_P0  : 5.99788e-02 ± 9.36151e-03
  CSA_P1  : 1.05662e-02 ± 7.05323e-04
  CSA_P2  : -5.59937e-05 ± 1.07412e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [6]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  0
 | P_BROKEN_FAST :  []
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  A ASIC READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2714', '1.800', '0.1648', '1.800', '0.0924', '7.000', '0.7078', 1, 1, 1, 1, 1727263989.124032]
VI_after__Init : ['1.201', '0.2714', '1.800', '0.1648', '1.800', '0.0869', '7.000', '0.7078', 1, 1, 1, 1, 1727263997.157495]
VI_at__the_End : ['1.201', '0.4986', '1.800', '0.1449', '1.800', '0.1146', '7.000', '0.7086', 1, 1, 1, 1, 1727264055.9697666]