TEST_NAME : Wafer
TEST_DATE : 24_09_25-13_38_03
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-032-006-009-06 | FUSED_ID : 6359364768406462614
  IC_TEMP :  -58.05 | VDDM : 1117.55 | AUX_INT :   -9.59 | CsaBias :   73.08
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.53383e-03 / 2
  ADC_P0  : -9.58931e-03 ± 2.65556e-02
  ADC_P1  : 8.32408e-03 ± 6.44193e-04
  ADC_P2  : -5.69245e-06 ± 3.11040e-06
  CSA_Chi2/NDF : 1.39452e-04 / 2
  CSA_P0  : 5.94477e-02 ± 7.87653e-03
  CSA_P1  : 9.99884e-03 ± 5.93440e-04
  CSA_P2  : -4.70216e-05 ± 9.03739e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  2
 | N_BROKEN_FAST :  [62, 82]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  1
 | P_BROKEN_FAST :  [44]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3388', '1.800', '0.1533', '1.799', '0.0871', '7.000', '0.7075', 1, 1, 1, 1, 1727264282.833918]
VI_after__Init : ['1.201', '0.3388', '1.800', '0.1533', '1.800', '0.0814', '7.000', '0.7074', 1, 1, 1, 1, 1727264290.9262257]
VI_at__the_End : ['1.202', '0.4969', '1.800', '0.1392', '1.799', '0.1103', '7.000', '0.7081', 1, 1, 1, 1, 1727264358.5660756]