TEST_NAME : Wafer
TEST_DATE : 24_09_25-13_39_41
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-032-006-010-06 | FUSED_ID : 6359364768406462630
  IC_TEMP :  -58.49 | VDDM : 1100.13 | AUX_INT :   -8.21 | CsaBias :   71.84
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.17276e-03 / 2
  ADC_P0  : -8.21277e-03 ± 2.32123e-02
  ADC_P1  : 8.05596e-03 ± 5.52925e-04
  ADC_P2  : -5.02768e-06 ± 2.61745e-06
  CSA_Chi2/NDF : 1.29893e-04 / 2
  CSA_P0  : 5.80251e-02 ± 7.60178e-03
  CSA_P1  : 9.63003e-03 ± 5.72739e-04
  CSA_P2  : -4.45519e-05 ± 8.72214e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  0
 | N_BROKEN_FAST :  []
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  1
 | P_BROKEN_FAST :  [41]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2554', '1.800', '0.1565', '1.799', '0.0867', '7.000', '0.7074', 1, 1, 1, 1, 1727264381.5453017]
VI_after__Init : ['1.202', '0.2554', '1.800', '0.1565', '1.800', '0.0813', '7.000', '0.7075', 1, 1, 1, 1, 1727264389.6626234]
VI_at__the_End : ['1.201', '0.4831', '1.800', '0.1373', '1.800', '0.1146', '7.000', '0.7082', 1, 1, 1, 1, 1727264449.4280167]