TEST_NAME : Wafer
TEST_DATE : 24_09_25-13_46_12
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
------------------------------------------------------------
------------------------------------------------------------
ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-032-006-014-06 | FUSED_ID : 6359364768406462694
  IC_TEMP :  -58.63 | VDDM : 1133.25 | AUX_INT :   -8.36 | CsaBias :   76.63
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.30365e-03 / 2
  ADC_P0  : -8.36056e-03 ± 2.44737e-02
  ADC_P1  : 8.55939e-03 ± 6.14675e-04
  ADC_P2  : -6.02392e-06 ± 3.05928e-06
  CSA_Chi2/NDF : 1.08380e-04 / 2
  CSA_P0  : 6.02365e-02 ± 6.94378e-03
  CSA_P1  : 9.82165e-03 ± 5.23164e-04
  CSA_P2  : -4.45817e-05 ± 7.96716e-06
------------------------------------------------------------
ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  4
 | N_BROKEN_FAST :  [21, 77, 103, 110]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  2
 | P_BROKEN_FAST :  [18, 61]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
------------------------------------------------------------
------------------------------------------------------------
VI_before_Init : ['1.202', '0.3607', '1.800', '0.1805', '1.800', '0.0922', '7.000', '0.7070', 1, 1, 1, 1, 1727264772.7809358]
VI_after__Init : ['1.202', '0.3607', '1.800', '0.1805', '1.800', '0.0866', '7.000', '0.7072', 1, 1, 1, 1, 1727264781.0082934]
VI_at__the_End : ['1.202', '0.4985', '1.799', '0.1398', '1.800', '0.1114', '7.000', '0.7078', 1, 1, 1, 1, 1727264841.4717002]