TEST_NAME : Wafer
TEST_DATE : 24_09_25-13_47_51
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-032-006-015-06 | FUSED_ID : 6359364768406462710
  IC_TEMP :  -58.69 | VDDM : 1126.10 | AUX_INT :   -8.98 | CsaBias :   73.53
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.29854e-03 / 2
  ADC_P0  : -8.98206e-03 ± 2.43903e-02
  ADC_P1  : 8.31230e-03 ± 5.84691e-04
  ADC_P2  : -6.11465e-06 ± 2.78194e-06
  CSA_Chi2/NDF : 1.28370e-04 / 2
  CSA_P0  : 5.94044e-02 ± 7.55709e-03
  CSA_P1  : 1.00117e-02 ± 5.69372e-04
  CSA_P2  : -4.81370e-05 ± 8.67086e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  2
 | N_BROKEN_FAST :  [32, 71]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  1
 | P_BROKEN_FAST :  [34]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2943', '1.800', '0.1842', '1.800', '0.0888', '7.000', '0.7069', 1, 1, 1, 1, 1727264870.5654576]
VI_after__Init : ['1.202', '0.2945', '1.800', '0.1843', '1.800', '0.0834', '7.000', '0.7071', 1, 1, 1, 1, 1727264879.4817364]
VI_at__the_End : ['1.202', '0.4977', '1.800', '0.1376', '1.800', '0.1116', '7.000', '0.7076', 1, 1, 1, 1, 1727264939.5551689]