TEST_NAME : Wafer
TEST_DATE : 24_09_25-13_51_06
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-032-006-017-01 | FUSED_ID : 6359364768406462737
  IC_TEMP :  -55.47 | VDDM : 1129.93 | AUX_INT :   -7.16 | CsaBias :   68.83
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.03630e-03 / 2
  ADC_P0  : -7.16486e-03 ± 2.17967e-02
  ADC_P1  : 8.49915e-03 ± 5.43734e-04
  ADC_P2  : -6.12333e-06 ± 2.67817e-06
  CSA_Chi2/NDF : 1.26305e-04 / 2
  CSA_P0  : 5.91018e-02 ± 7.49606e-03
  CSA_P1  : 1.01179e-02 ± 5.64774e-04
  CSA_P2  : -4.83464e-05 ± 8.60084e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  3
 | N_BROKEN_FAST :  [50, 89, 113]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  0
 | P_BROKEN_FAST :  []
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.1388', '1.799', '0.1808', '1.800', '0.0885', '7.000', '0.7071', 1, 1, 1, 1, 1727265066.1174428]
VI_after__Init : ['1.202', '0.1388', '1.800', '0.1808', '1.801', '0.0831', '7.000', '0.7069', 1, 1, 1, 1, 1727265075.0757172]
VI_at__the_End : ['1.201', '0.5008', '1.800', '0.1389', '1.799', '0.1121', '7.000', '0.7076', 1, 1, 1, 1, 1727265134.811097]