TEST_NAME : Wafer
TEST_DATE : 24_09_25-13_54_23
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-032-006-019-01 | FUSED_ID : 6359364768406462769
  IC_TEMP :  -54.79 | VDDM : 1126.00 | AUX_INT :   -9.20 | CsaBias :   95.86
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.33854e-03 / 2
  ADC_P0  : -9.20297e-03 ± 2.47552e-02
  ADC_P1  : 8.15852e-03 ± 5.81719e-04
  ADC_P2  : -5.91034e-06 ± 2.71422e-06
  CSA_Chi2/NDF : 7.60110e-05 / 2
  CSA_P0  : 5.85760e-02 ± 5.81514e-03
  CSA_P1  : 9.30224e-03 ± 4.38129e-04
  CSA_P2  : -3.80294e-05 ± 6.67219e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  0
 | N_BROKEN_FAST :  []
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  2
 | P_BROKEN_FAST :  [5, 105]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3917', '1.800', '0.1616', '1.800', '0.0942', '7.000', '0.7079', 1, 1, 1, 1, 1727265262.8203044]
VI_after__Init : ['1.201', '0.3917', '1.800', '0.1616', '1.800', '0.0871', '7.000', '0.7073', 1, 1, 1, 1, 1727265271.524624]
VI_at__the_End : ['1.201', '0.4906', '1.800', '0.1351', '1.802', '0.1110', '7.000', '0.7077', 1, 1, 1, 1, 1727265339.8193843]