TEST_NAME : Wafer
TEST_DATE : 24_09_25-13_56_00
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-032-006-020-01 | FUSED_ID : 6359364768406462785
  IC_TEMP :  -57.86 | VDDM : 1127.10 | AUX_INT :   -6.62 | CsaBias :   80.43
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 9.64472e-04 / 2
  ADC_P0  : -6.61513e-03 ± 2.10378e-02
  ADC_P1  : 7.96796e-03 ± 4.98921e-04
  ADC_P2  : -5.01629e-06 ± 2.33631e-06
  CSA_Chi2/NDF : 1.31183e-04 / 2
  CSA_P0  : 5.88484e-02 ± 7.63944e-03
  CSA_P1  : 9.94816e-03 ± 5.75577e-04
  CSA_P2  : -4.57699e-05 ± 8.76536e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [27]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  1
 | P_BROKEN_FAST :  [75]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2783', '1.800', '0.1700', '1.800', '0.0884', '7.000', '0.7070', 1, 1, 1, 1, 1727265360.1508815]
VI_after__Init : ['1.201', '0.2785', '1.800', '0.1700', '1.800', '0.0832', '7.000', '0.7074', 1, 1, 1, 1, 1727265369.0830631]
VI_at__the_End : ['1.201', '0.5000', '1.800', '0.1391', '1.802', '0.1104', '7.000', '0.7078', 1, 1, 1, 1, 1727265428.3515735]