TEST_NAME : Wafer
TEST_DATE : 24_09_25-13_57_38
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-032-006-021-01 | FUSED_ID : 6359364768406462801
  IC_TEMP :  -58.82 | VDDM : 1120.55 | AUX_INT :   -7.58 | CsaBias :   73.55
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 9.92337e-04 / 2
  ADC_P0  : -7.57747e-03 ± 2.13216e-02
  ADC_P1  : 8.16737e-03 ± 5.12124e-04
  ADC_P2  : -5.46681e-06 ± 2.43682e-06
  CSA_Chi2/NDF : 1.36391e-04 / 2
  CSA_P0  : 5.76347e-02 ± 7.78959e-03
  CSA_P1  : 9.75890e-03 ± 5.86889e-04
  CSA_P2  : -4.48879e-05 ± 8.93763e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  2
 | N_BROKEN_FAST :  [39, 95]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  0
 | P_BROKEN_FAST :  []
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.4346', '1.800', '0.1646', '1.800', '0.0936', '7.000', '0.7071', 1, 1, 1, 1, 1727265458.310323]
VI_after__Init : ['1.201', '0.4331', '1.800', '0.1646', '1.800', '0.0882', '7.000', '0.7072', 1, 1, 1, 1, 1727265467.0356834]
VI_at__the_End : ['1.201', '0.4876', '1.800', '0.1373', '1.801', '0.1137', '7.000', '0.7079', 1, 1, 1, 1, 1727265536.5232422]