TEST_NAME : Wafer
TEST_DATE : 24_09_25-13_59_16
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-032-006-022-01 | FUSED_ID : 6359364768406462817
  IC_TEMP :  -52.35 | VDDM : 1133.61 | AUX_INT :   -7.50 | CsaBias :   76.69
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.04639e-03 / 2
  ADC_P0  : -7.50407e-03 ± 2.19094e-02
  ADC_P1  : 8.47787e-03 ± 5.48353e-04
  ADC_P2  : -5.80293e-06 ± 2.71631e-06
  CSA_Chi2/NDF : 1.11415e-04 / 2
  CSA_P0  : 5.77304e-02 ± 7.04036e-03
  CSA_P1  : 1.00226e-02 ± 5.30440e-04
  CSA_P2  : -4.55377e-05 ± 8.07797e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [3]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  0
 | P_BROKEN_FAST :  []
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2932', '1.800', '0.1633', '1.800', '0.0880', '7.000', '0.7071', 1, 1, 1, 1, 1727265556.0018198]
VI_after__Init : ['1.202', '0.2933', '1.800', '0.1629', '1.802', '0.0824', '7.000', '0.7072', 1, 1, 1, 1, 1727265564.0543258]
VI_at__the_End : ['1.201', '0.5056', '1.800', '0.1384', '1.801', '0.1094', '7.000', '0.7079', 1, 1, 1, 1, 1727265632.7315369]