TEST_NAME : Wafer
TEST_DATE : 24_09_25-14_02_32
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-032-006-024-01 | FUSED_ID : 6359364768406462849
  IC_TEMP :  -56.74 | VDDM : 1112.63 | AUX_INT :   -9.93 | CsaBias :   87.79
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.72819e-03 / 2
  ADC_P0  : -9.93191e-03 ± 2.82190e-02
  ADC_P1  : 8.20892e-03 ± 6.76685e-04
  ADC_P2  : -5.41891e-06 ± 3.23248e-06
  CSA_Chi2/NDF : 9.82709e-05 / 2
  CSA_P0  : 5.75088e-02 ± 6.61203e-03
  CSA_P1  : 9.29803e-03 ± 4.98169e-04
  CSA_P2  : -3.82404e-05 ± 7.58652e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [31]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  1
 | P_BROKEN_FAST :  [106]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2038', '1.800', '0.1512', '1.800', '0.0805', '7.000', '0.7075', 1, 1, 1, 1, 1727265751.6033998]
VI_after__Init : ['1.202', '0.2039', '1.800', '0.1512', '1.800', '0.0757', '7.000', '0.7076', 1, 1, 1, 1, 1727265759.7957273]
VI_at__the_End : ['1.201', '0.4881', '1.800', '0.1350', '1.801', '0.1121', '7.000', '0.7079', 1, 1, 1, 1, 1727265828.3428996]