TEST_NAME : Wafer
TEST_DATE : 24_09_25-14_44_56
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-032-007-003-11 | FUSED_ID : 6359364768406466619
  IC_TEMP :  -57.91 | VDDM : 1122.67 | AUX_INT :   -8.23 | CsaBias :   76.89
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.34586e-03 / 2
  ADC_P0  : -8.22672e-03 ± 2.48590e-02
  ADC_P1  : 8.57451e-03 ± 6.22307e-04
  ADC_P2  : -6.30602e-06 ± 3.07964e-06
  CSA_Chi2/NDF : 1.24884e-04 / 2
  CSA_P0  : 5.68175e-02 ± 7.45377e-03
  CSA_P1  : 9.72300e-03 ± 5.61588e-04
  CSA_P2  : -4.45312e-05 ± 8.55232e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  0
 | N_BROKEN_FAST :  []
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  1
 | P_BROKEN_FAST :  [32]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2768', '1.799', '0.1687', '1.799', '0.0902', '7.000', '0.7079', 1, 1, 1, 1, 1727268295.8320878]
VI_after__Init : ['1.202', '0.2769', '1.800', '0.1688', '1.800', '0.0845', '7.000', '0.7080', 1, 1, 1, 1, 1727268303.905469]
VI_at__the_End : ['1.201', '0.4908', '1.800', '0.1368', '1.800', '0.1112', '7.000', '0.7084', 1, 1, 1, 1, 1727268366.75258]