TEST_NAME : Wafer
TEST_DATE : 24_09_25-14_43_18
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-032-007-004-11 | FUSED_ID : 6359364768406466635
  IC_TEMP :  -58.75 | VDDM : 1112.97 | AUX_INT :   -7.23 | CsaBias :   69.22
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.26789e-03 / 2
  ADC_P0  : -7.23235e-03 ± 2.41357e-02
  ADC_P1  : 8.54859e-03 ± 6.06186e-04
  ADC_P2  : -5.99998e-06 ± 3.01703e-06
  CSA_Chi2/NDF : 1.47002e-04 / 2
  CSA_P0  : 5.60694e-02 ± 8.08693e-03
  CSA_P1  : 9.84840e-03 ± 6.09292e-04
  CSA_P2  : -4.61727e-05 ± 9.27879e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  0
 | N_BROKEN_FAST :  []
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  1
 | P_BROKEN_FAST :  [51]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  A ASIC READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.4195', '1.800', '0.1682', '1.800', '0.0944', '7.000', '0.7078', 1, 1, 1, 1, 1727268197.9248755]
VI_after__Init : ['1.202', '0.4202', '1.800', '0.1682', '1.800', '0.0889', '7.000', '0.7078', 1, 1, 1, 1, 1727268205.9911923]
VI_at__the_End : ['1.202', '0.4897', '1.800', '0.1398', '1.800', '0.1134', '7.000', '0.7087', 1, 1, 1, 1, 1727268271.9559953]