TEST_NAME : Wafer
TEST_DATE : 24_09_25-14_41_39
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-032-007-005-11 | FUSED_ID : 6359364768406466651
  IC_TEMP :  -61.07 | VDDM : 1123.62 | AUX_INT :  -12.49 | CsaBias :   74.06
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 2.42731e-03 / 2
  ADC_P0  : -1.24888e-02 ± 3.34287e-02
  ADC_P1  : 8.72269e-03 ± 8.27208e-04
  ADC_P2  : -6.76214e-06 ± 4.09800e-06
  CSA_Chi2/NDF : 1.86970e-04 / 2
  CSA_P0  : 5.86264e-02 ± 9.12028e-03
  CSA_P1  : 9.96808e-03 ± 6.87147e-04
  CSA_P2  : -4.82532e-05 ± 1.04644e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  0
 | N_BROKEN_FAST :  []
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  0
 | P_BROKEN_FAST :  []
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.4507', '1.800', '0.1672', '1.799', '0.0997', '7.000', '0.7078', 1, 1, 1, 1, 1727268099.7055068]
VI_after__Init : ['1.201', '0.4511', '1.800', '0.1674', '1.799', '0.0943', '7.000', '0.7079', 1, 1, 1, 1, 1727268107.7808893]
VI_at__the_End : ['1.201', '0.4924', '1.800', '0.1408', '1.800', '0.1134', '7.000', '0.7086', 1, 1, 1, 1, 1727268167.3220983]