TEST_NAME : Wafer
TEST_DATE : 24_09_25-14_40_01
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-032-007-006-11 | FUSED_ID : 6359364768406466667
  IC_TEMP :  -59.51 | VDDM : 1126.07 | AUX_INT :   -6.02 | CsaBias :   79.22
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 8.81838e-04 / 2
  ADC_P0  : -6.02113e-03 ± 2.00916e-02
  ADC_P1  : 8.58759e-03 ± 5.08394e-04
  ADC_P2  : -6.33989e-06 ± 2.52949e-06
  CSA_Chi2/NDF : 1.44834e-04 / 2
  CSA_P0  : 5.75257e-02 ± 8.02709e-03
  CSA_P1  : 9.83033e-03 ± 6.04783e-04
  CSA_P2  : -4.57370e-05 ± 9.21014e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [70]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  0
 | P_BROKEN_FAST :  []
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2082', '1.800', '0.1591', '1.800', '0.0908', '7.000', '0.7089', 1, 1, 1, 1, 1727268000.6965015]
VI_after__Init : ['1.202', '0.2082', '1.800', '0.1590', '1.800', '0.0828', '7.000', '0.7079', 1, 1, 1, 1, 1727268009.504872]
VI_at__the_End : ['1.202', '0.4903', '1.800', '0.1413', '1.802', '0.1135', '7.000', '0.7085', 1, 1, 1, 1, 1727268071.0728612]