TEST_NAME : Wafer
TEST_DATE : 24_09_25-14_38_23
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
------------------------------------------------------------
------------------------------------------------------------
ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-032-007-007-11 | FUSED_ID : 6359364768406466683
  IC_TEMP :  -56.73 | VDDM : 1130.23 | AUX_INT :   -7.52 | CsaBias :   67.69
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.24481e-03 / 2
  ADC_P0  : -7.52211e-03 ± 2.38409e-02
  ADC_P1  : 8.41913e-03 ± 5.74091e-04
  ADC_P2  : -6.96007e-06 ± 2.71366e-06
  CSA_Chi2/NDF : 9.87553e-05 / 2
  CSA_P0  : 5.67706e-02 ± 6.62831e-03
  CSA_P1  : 9.45414e-03 ± 4.99395e-04
  CSA_P2  : -4.03101e-05 ± 7.60520e-06
------------------------------------------------------------
ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  3
 | N_BROKEN_FAST :  [67, 75, 96]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  0
 | P_BROKEN_FAST :  []
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
------------------------------------------------------------
------------------------------------------------------------
VI_before_Init : ['1.202', '0.3566', '1.800', '0.1385', '1.800', '0.0915', '7.000', '0.7078', 1, 1, 1, 1, 1727267903.5843966]
VI_after__Init : ['1.202', '0.3568', '1.800', '0.1387', '1.800', '0.0862', '7.000', '0.7077', 1, 1, 1, 1, 1727267911.7237046]
VI_at__the_End : ['1.198', '0.4860', '1.800', '0.1349', '1.800', '0.1110', '7.000', '0.7090', 1, 1, 1, 1, 1727267976.3604505]