TEST_NAME : Wafer
TEST_DATE : 24_09_25-14_36_46
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-032-007-008-11 | FUSED_ID : 6359364768406466699
  IC_TEMP :  -53.91 | VDDM : 1125.15 | AUX_INT :   -7.94 | CsaBias :   81.90
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.25408e-03 / 2
  ADC_P0  : -7.93633e-03 ± 2.39976e-02
  ADC_P1  : 8.22922e-03 ± 5.79560e-04
  ADC_P2  : -5.65905e-06 ± 2.76766e-06
  CSA_Chi2/NDF : 1.32098e-04 / 2
  CSA_P0  : 5.80260e-02 ± 7.66602e-03
  CSA_P1  : 9.87739e-03 ± 5.77580e-04
  CSA_P2  : -4.57216e-05 ± 8.79585e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [109]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  1
 | P_BROKEN_FAST :  [97]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.4428', '1.800', '0.1487', '1.800', '0.0963', '7.000', '0.7080', 1, 1, 1, 1, 1727267806.10632]
VI_after__Init : ['1.201', '0.4434', '1.800', '0.1488', '1.800', '0.0908', '7.000', '0.7082', 1, 1, 1, 1, 1727267814.1626174]
VI_at__the_End : ['1.202', '0.4948', '1.800', '0.1370', '1.800', '0.1119', '7.000', '0.7086', 1, 1, 1, 1, 1727267873.5997736]