TEST_NAME : Wafer
TEST_DATE : 24_09_25-14_35_08
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-032-007-009-11 | FUSED_ID : 6359364768406466715
  IC_TEMP :  -57.78 | VDDM : 1144.45 | AUX_INT : -185.77 | CsaBias :  -56.47
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 7.32917e-04 / 2
  ADC_P0  : -1.85769e-01 ± 2.54299e-02
  ADC_P1  : 1.09550e-02 ± 5.79490e-04
  ADC_P2  : -1.50473e-05 ± 2.58517e-06
  CSA_Chi2/NDF : 1.12584e-04 / 2
  CSA_P0  : 5.82996e-02 ± 7.07720e-03
  CSA_P1  : 9.82743e-03 ± 5.33216e-04
  CSA_P2  : -4.50231e-05 ± 8.12025e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  3
 | N_BROKEN_FAST :  [61, 76, 96]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  2
 | P_BROKEN_FAST :  [21, 61]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2190', '1.800', '0.1173', '1.800', '0.0814', '7.000', '0.7079', 1, 1, 1, 1, 1727267707.77646]
VI_after__Init : ['1.202', '0.2190', '1.800', '0.1172', '1.800', '0.0761', '7.000', '0.7079', 1, 1, 1, 1, 1727267715.7817538]
VI_at__the_End : ['1.201', '0.4932', '1.800', '0.1361', '1.800', '0.1115', '7.000', '0.7083', 1, 1, 1, 1, 1727267778.8775651]