TEST_NAME : Wafer
TEST_DATE : 24_09_25-14_33_30
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-032-007-010-11 | FUSED_ID : 6359364768406466731
  IC_TEMP :  -60.03 | VDDM : 1122.47 | AUX_INT :  -10.86 | CsaBias :   71.30
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 2.02940e-03 / 2
  ADC_P0  : -1.08613e-02 ± 3.06105e-02
  ADC_P1  : 8.27015e-03 ± 7.38865e-04
  ADC_P2  : -5.35532e-06 ± 3.56537e-06
  CSA_Chi2/NDF : 1.69897e-04 / 2
  CSA_P0  : 5.84893e-02 ± 8.69391e-03
  CSA_P1  : 1.00470e-02 ± 6.55023e-04
  CSA_P2  : -5.02346e-05 ± 9.97523e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  3
 | N_BROKEN_FAST :  [52, 55, 81]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  0
 | P_BROKEN_FAST :  []
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3192', '1.800', '0.1479', '1.800', '0.0880', '7.000', '0.7078', 1, 1, 1, 1, 1727267609.5286708]
VI_after__Init : ['1.201', '0.3191', '1.800', '0.1479', '1.800', '0.0822', '7.000', '0.7077', 1, 1, 1, 1, 1727267618.3129394]
VI_at__the_End : ['1.202', '0.4875', '1.799', '0.1363', '1.800', '0.1139', '7.000', '0.7086', 1, 1, 1, 1, 1727267678.4848626]