TEST_NAME : Wafer
TEST_DATE : 24_09_25-14_31_52
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-032-007-011-11 | FUSED_ID : 6359364768406466747
  IC_TEMP :  -61.47 | VDDM : 1121.29 | AUX_INT :  -97.80 | CsaBias :   -1.01
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.90635e-03 / 2
  ADC_P0  : -9.78004e-02 ± 3.50928e-02
  ADC_P1  : 9.78341e-03 ± 8.38672e-04
  ADC_P2  : -1.04479e-05 ± 3.95456e-06
  CSA_Chi2/NDF : 1.54707e-04 / 2
  CSA_P0  : 5.77665e-02 ± 8.29616e-03
  CSA_P1  : 1.00759e-02 ± 6.25056e-04
  CSA_P2  : -5.13436e-05 ± 9.51886e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [46]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  1
 | P_BROKEN_FAST :  [46]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.1957', '1.800', '0.1491', '1.800', '0.0840', '7.000', '0.7078', 1, 1, 1, 1, 1727267512.2671373]
VI_after__Init : ['1.202', '0.1957', '1.800', '0.1490', '1.800', '0.0785', '7.000', '0.7077', 1, 1, 1, 1, 1727267520.9964828]
VI_at__the_End : ['1.201', '0.4845', '1.800', '0.1372', '1.801', '0.1131', '7.000', '0.7085', 1, 1, 1, 1, 1727267582.2658224]