TEST_NAME : Wafer
TEST_DATE : 24_09_25-14_30_14
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-032-007-012-11 | FUSED_ID : 6359364768406466763
  IC_TEMP :  -59.96 | VDDM : 1125.44 | AUX_INT :   -8.66 | CsaBias :   80.49
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.44084e-03 / 2
  ADC_P0  : -8.65933e-03 ± 2.57325e-02
  ADC_P1  : 8.16733e-03 ± 6.11160e-04
  ADC_P2  : -5.75306e-06 ± 2.87479e-06
  CSA_Chi2/NDF : 1.46709e-04 / 2
  CSA_P0  : 5.92350e-02 ± 8.07887e-03
  CSA_P1  : 1.00521e-02 ± 6.08684e-04
  CSA_P2  : -4.77632e-05 ± 9.26954e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  3
 | N_BROKEN_FAST :  [24, 95, 123]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  0
 | P_BROKEN_FAST :  []
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3203', '1.800', '0.1759', '1.800', '0.0936', '7.000', '0.7078', 1, 1, 1, 1, 1727267414.762363]
VI_after__Init : ['1.202', '0.3204', '1.800', '0.1759', '1.800', '0.0880', '7.000', '0.7079', 1, 1, 1, 1, 1727267422.8178248]
VI_at__the_End : ['1.201', '0.4987', '1.800', '0.1392', '1.800', '0.1118', '7.000', '0.7084', 1, 1, 1, 1, 1727267482.5272944]