TEST_NAME : Wafer
TEST_DATE : 24_09_25-14_28_36
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-032-007-013-11 | FUSED_ID : 6359364768406466779
  IC_TEMP :  -58.37 | VDDM : 1124.72 | AUX_INT :   -6.86 | CsaBias :   67.32
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.03349e-03 / 2
  ADC_P0  : -6.86191e-03 ± 2.17762e-02
  ADC_P1  : 8.29243e-03 ± 5.34940e-04
  ADC_P2  : -5.57771e-06 ± 2.59406e-06
  CSA_Chi2/NDF : 1.10843e-04 / 2
  CSA_P0  : 5.92587e-02 ± 7.02225e-03
  CSA_P1  : 9.79825e-03 ± 5.29075e-04
  CSA_P2  : -4.48319e-05 ± 8.05719e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  2
 | N_BROKEN_FAST :  [26, 55]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  0
 | P_BROKEN_FAST :  []
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2593', '1.800', '0.1446', '1.800', '0.0888', '7.000', '0.7078', 1, 1, 1, 1, 1727267316.5217974]
VI_after__Init : ['1.202', '0.2593', '1.800', '0.1446', '1.800', '0.0833', '7.000', '0.7078', 1, 1, 1, 1, 1727267324.7042177]
VI_at__the_End : ['1.202', '0.4950', '1.800', '0.1391', '1.800', '0.1124', '7.000', '0.7086', 1, 1, 1, 1, 1727267388.8863516]