TEST_NAME : Wafer
TEST_DATE : 24_09_25-14_26_58
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-032-007-014-11 | FUSED_ID : 6359364768406466795
  IC_TEMP :  -58.53 | VDDM : 1119.22 | AUX_INT :   -9.28 | CsaBias :   81.43
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.36882e-03 / 2
  ADC_P0  : -9.28299e-03 ± 2.50416e-02
  ADC_P1  : 8.31396e-03 ± 6.00304e-04
  ADC_P2  : -6.13147e-06 ± 2.85623e-06
  CSA_Chi2/NDF : 1.27026e-04 / 2
  CSA_P0  : 5.86772e-02 ± 7.51743e-03
  CSA_P1  : 9.86794e-03 ± 5.66384e-04
  CSA_P2  : -4.68143e-05 ± 8.62536e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [87]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  2
 | P_BROKEN_FAST :  [87, 119]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2168', '1.800', '0.1233', '1.800', '0.0847', '7.000', '0.7084', 1, 1, 1, 1, 1727267218.7581244]
VI_after__Init : ['1.202', '0.2167', '1.799', '0.1233', '1.800', '0.0773', '7.000', '0.7079', 1, 1, 1, 1, 1727267226.7686172]
VI_at__the_End : ['1.201', '0.4915', '1.800', '0.1381', '1.801', '0.1139', '7.000', '0.7086', 1, 1, 1, 1, 1727267290.8177607]