TEST_NAME : Wafer
TEST_DATE : 24_09_25-14_20_28
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-032-007-018-12 | FUSED_ID : 6359364768406466860
  IC_TEMP :  -58.14 | VDDM : 1127.77 | AUX_INT :   -8.75 | CsaBias :   79.88
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.27115e-03 / 2
  ADC_P0  : -8.75370e-03 ± 2.41416e-02
  ADC_P1  : 8.11932e-03 ± 5.70265e-04
  ADC_P2  : -5.60699e-06 ± 2.67283e-06
  CSA_Chi2/NDF : 1.36949e-04 / 2
  CSA_P0  : 6.00037e-02 ± 7.80551e-03
  CSA_P1  : 9.94529e-03 ± 5.88089e-04
  CSA_P2  : -4.79569e-05 ± 8.95589e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [90]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  1
 | P_BROKEN_FAST :  [78]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.1172', '1.800', '0.1464', '1.799', '0.0887', '7.000', '0.7077', 1, 1, 1, 1, 1727266828.1514165]
VI_after__Init : ['1.201', '0.1172', '1.800', '0.1463', '1.800', '0.0835', '7.000', '0.7079', 1, 1, 1, 1, 1727266836.1359653]
VI_at__the_End : ['1.202', '0.4945', '1.800', '0.1372', '1.800', '0.1135', '7.000', '0.7084', 1, 1, 1, 1, 1727266895.4444418]