TEST_NAME : Wafer
TEST_DATE : 24_09_25-14_18_50
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-032-007-019-12 | FUSED_ID : 6359364768406466876
  IC_TEMP :  -54.87 | VDDM : 1125.55 | AUX_INT :   -9.08 | CsaBias :   81.50
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.34306e-03 / 2
  ADC_P0  : -9.08385e-03 ± 2.48049e-02
  ADC_P1  : 8.30157e-03 ± 5.94630e-04
  ADC_P2  : -6.06364e-06 ± 2.82923e-06
  CSA_Chi2/NDF : 1.05176e-04 / 2
  CSA_P0  : 5.86792e-02 ± 6.84039e-03
  CSA_P1  : 9.55853e-03 ± 5.15374e-04
  CSA_P2  : -4.18909e-05 ± 7.84853e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  3
 | N_BROKEN_FAST :  [15, 64, 75]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  1
 | P_BROKEN_FAST :  [104]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.4177', '1.800', '0.1304', '1.800', '0.0995', '7.000', '0.7085', 1, 1, 1, 1, 1727266730.335784]
VI_after__Init : ['1.201', '0.4182', '1.800', '0.1305', '1.800', '0.0926', '7.000', '0.7079', 1, 1, 1, 1, 1727266738.48919]
VI_at__the_End : ['1.201', '0.4919', '1.800', '0.1382', '1.800', '0.1117', '7.000', '0.7082', 1, 1, 1, 1, 1727266803.3022323]