TEST_NAME : Wafer
TEST_DATE : 24_09_25-14_13_57
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-032-007-022-12 | FUSED_ID : 6359364768406466924
  IC_TEMP :  -50.93 | VDDM : 1123.37 | AUX_INT :  -10.29 | CsaBias :   85.79
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.58804e-03 / 2
  ADC_P0  : -1.02887e-02 ± 2.69828e-02
  ADC_P1  : 8.07487e-03 ± 6.25678e-04
  ADC_P2  : -5.69518e-06 ± 2.89158e-06
  CSA_Chi2/NDF : 5.62033e-05 / 2
  CSA_P0  : 5.65432e-02 ± 5.00038e-03
  CSA_P1  : 9.09683e-03 ± 3.76743e-04
  CSA_P2  : -3.48222e-05 ± 5.73735e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  4
 | N_BROKEN_FAST :  [2, 93, 103, 121]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  0
 | P_BROKEN_FAST :  []
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.1871', '1.800', '0.1169', '1.800', '0.0825', '7.000', '0.7084', 1, 1, 1, 1, 1727266436.7186167]
VI_after__Init : ['1.202', '0.1871', '1.800', '0.1169', '1.800', '0.0755', '7.000', '0.7076', 1, 1, 1, 1, 1727266445.4849193]
VI_at__the_End : ['1.201', '0.4880', '1.800', '0.1337', '1.800', '0.1097', '7.000', '0.7083', 1, 1, 1, 1, 1727266505.5145307]